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"A Die Selection and Matching Method with Two Stages for Yield Enhancement ..."

Wooheon Kang et al. (2013)

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DOI: 10.1109/ATS.2013.62

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-15

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Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306

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