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Keewon Cho
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- affiliation: Yonsei University, Seoul, South Korea
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2020 – today
- 2022
- [c7]Seong Ju Lee, Kyu-Young Kim, Sanghoon Oh, Joonhong Park, Gimoon Hong, Dong Yoon Ka, Kyu-Dong Hwang, Jeongje Park, Kyeong Pil Kang, Jungyeon Kim, Junyeol Jeon, Nahsung Kim, Yongkee Kwon, Kornijcuk Vladimir, Woojae Shin, Jongsoon Won, Minkyu Lee, Hyunha Joo, Haerang Choi, Jaewook Lee, Donguc Ko, Younggun Jun, Keewon Cho, Ilwoong Kim, Choungki Song, Chunseok Jeong, Dae-Han Kwon, Jieun Jang, Il Park, Junhyun Chun, Joohwan Cho:
A 1ynm 1.25V 8Gb, 16Gb/s/pin GDDR6-based Accelerator-in-Memory supporting 1TFLOPS MAC Operation and Various Activation Functions for Deep-Learning Applications. ISSCC 2022: 1-3 - 2020
- [c6]Hayoung Lee
, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong:
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9
2010 – 2019
- 2019
- [j7]Keewon Cho
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 551-561 (2019) - 2018
- [j6]Sungyoul Seo
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 391-403 (2018) - [j5]Hayoung Lee
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018) - [j4]Hayoung Lee
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67(1): 264-273 (2018) - [c5]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC 2018: 21-22 - 2017
- [j3]Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 844-856 (2017) - [c4]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An efficient built-in self-repair scheme for area reduction. ISOCC 2017: 105-106 - 2016
- [j2]Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang:
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49(3): 47:1-47:41 (2016) - [c3]Keewon Cho, Jooyoung Kim, Hayoung Lee
Discussion of cost-effective redundancy architectures. ISOCC 2016: 97-98 - 2015
- [c2]Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang:
Near optimal repair rate built-in redundancy analysis with very small hardware overhead. ISQED 2015: 435-439 - 2014
- [j1]Hyungsu Sung, Keewon Cho, Kunsang Yoon, Sungho Kang:
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2380-2387 (2014) - 2013
- [c1]Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306
Coauthor Index
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