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Kumpei Yoshikawa

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2010 – 2019

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2015
[j5]
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  - journals/tvlsi/SawadaYTNN15
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  - https://dblp.org/rec/journals/tvlsi/SawadaYTNN15
Takuya Sawada, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata:
An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference. IEEE Trans. Very Large Scale Integr. Syst. 23(10): 2347-2351 (2015)
2014
[j4]
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Kumpei Yoshikawa, Kouji Ichikawa, Makoto Nagata:
AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model. IEICE Trans. Electron. 97-C(4): 264-271 (2014)
[c3]
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  - conf/vlsi-dat/HayashiMYN14
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Taisuke Hayashi, Noriyuki Miura, Kumpei Yoshikawa, Makoto Nagata:
A passive supply-resonance suppression filter utilizing inductance-enhanced coupled bonding-wire coils. VLSI-DAT 2014: 1-4
2013
[j3]
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  - journals/ieicet/OkumotoYN13
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Takeshi Okumoto, Kumpei Yoshikawa, Makoto Nagata:
Design of Effective Supply Voltage Monitor for Measuring Power Rails of Integrated Circuits. IEICE Trans. Electron. 96-C(4): 538-545 (2013)
[c2]
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  - conf/emccompo/MurataAIITNYAH13
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Akitaka Murata, Shuji Agatsuma, Daisaku Ikoma, Kouji Ichikawa, Takahiro Tsuda, Makoto Nagata, Kumpei Yoshikawa, Yuuki Araga, Yuji Harada:
Noise analysis using on-chip waveform monitor in bandgap voltage references. EMC Compo 2013: 226-231
[c1]
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  - conf/emccompo/YoshikawaHMTSN13
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Kumpei Yoshikawa, Yuji Harada, Noriyuki Miura, Noriaki Takeda, Yoshiyuki Saito, Makoto Nagata:
Immunity evaluation of inverter chains against RF power on power delivery network. EMC Compo 2013: 232-237
2012
[j2]
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  - journals/ieicet/SawadaTYTNN12
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Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata:
Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation. IEICE Trans. Electron. 95-C(4): 586-593 (2012)
[j1]
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  - journals/ieicet/YoshikawaSISN12
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Kumpei Yoshikawa, Yuta Sasaki, Kouji Ichikawa, Yoshiyuki Saito, Makoto Nagata:
Co-simulation of On-Chip and On-Board AC Power Noise of CMOS Digital Circuits. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 95-A(12): 2284-2291 (2012)

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