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"Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation."

Takuya Sawada et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.586

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/SawadaTYTNN12
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/SawadaTYTNN12
Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata:
Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation. IEICE Trans. Electron. 95-C(4): 586-593 (2012)

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