default search action
Jwu E. Chen
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2023
- [j20]Chung-Huang Yeh
, Jwu E. Chen:
Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments. IEEE Des. Test 40(3): 45-52 (2023) - [j19]Chung-Huang Yeh
Multiple Retest Systems for Screening High-Quality Chips. J. Electron. Test. 39(2): 207-225 (2023) - [j18]Chung-Huang Yeh
Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method. J. Circuits Syst. Comput. 32(12): 2350202:1-2350202:20 (2023) - 2022
- [j17]Chung-Huang Yeh
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect. Sensors 22(11): 4158 (2022) - 2021
- [c37]Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. ETS 2021: 1-2 - [c36]Leon Li-Yang Chen, Katherine Shu-Min Li, Xu-Hao Jiang, Sying-Jyan Wang
Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling. ITC 2021: 208-212 - 2020
- [c35]Ken Chau-Cheung Cheng
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. DATE 2020: 1710-1711 - [c34]Chung-Huang Yeh
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. ITC-Asia 2020: 88-93 - [c33]Dyi-Chung Hu, Hirohito Hashimoto, Li-Fong Tseng, Ken Chau-Cheung Cheng
Innovative Practice on Wafer Test Innovations. VTS 2020: 1
2010 – 2019
- 2019
- [j16]Chung-Huang Yeh
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements. J. Electron. Test. 35(4): 459-472 (2019)
2000 – 2009
- 2009
- [j15]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus. IEEE Trans. Very Large Scale Integr. Syst. 17(2): 306-311 (2009) - 2007
- [j14]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection. J. Electron. Test. 23(4): 341-355 (2007) - [j13]Katherine Shu-Min Li, Yao-Wen Chang
Multilevel Full-Chip Routing With Testability and Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(9): 1625-1636 (2007) - 2006
- [j12]Katherine Shu-Min Li, Chauchin Su, Yao-Wen Chang
IEEE Standard 1500 Compatible Interconnect Diagnosis for Delay and Crosstalk Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2513-2525 (2006) - [c32]Katherine Shu-Min Li, Yao-Wen Chang, Chauchin Su, Chung-Len Lee, Jwu E. Chen:
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults. ASP-DAC 2006: 366-371 - [c31]Shih Ping Lin, Chung-Len Lee, Jwu E. Chen, Ji-Jan Chen, Kun-Lun Luo, Wen Ching Wu:
A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs. ITC 2006: 1-8 - 2005
- [c30]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Oscillation ring based interconnect test scheme for SOC. ASP-DAC 2005: 184-187 - [c29]Shih Ping Lin, Chung-Len Lee, Jwu E. Chen:
A Scan Matrix Design for Low Power Scan-Based Test. Asian Test Symposium 2005: 224-229 - [c28]Shih Ping Lin, Chung-Len Lee, Jwu E. Chen:
Adaptive Encoding Scheme for Test Volume/Time Reduction in SoC Scan Testing. Asian Test Symposium 2005: 324-329 - [c27]Katherine Shu-Min Li, Chung-Len Lee, Tagin Jiang, Chauchin Su, Jwu E. Chen:
Finite State Machine Synthesis for At-Speed Oscillation Testability. Asian Test Symposium 2005: 360-365 - [c26]Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang, Chauchin Su, Jwu E. Chen:
Multilevel full-chip routing with testability and yield enhancement. SLIP 2005: 29-36 - 2004
- [c25]Guan-Xun Chen, Chung-Len Lee, Jwu E. Chen:
A New BIST Scheme Based on a Summing-into-Timing-Signal Principle with Self Calibration for the DAC. Asian Test Symposium 2004: 58-61 - [c24]Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI. Asian Test Symposium 2004: 145-150 - 2003
- [j11]Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen:
Structure-Based Specification-Constrained Test Frequency Generation for Linear Analog Circuits. J. Inf. Sci. Eng. 19(4): 637-651 (2003) - 2002
- [j10]Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen:
Structural Fault Based Specification Reduction for Testing Analog Circuits. J. Electron. Test. 18(6): 571-581 (2002) - [c23]Ming Shae Wu, Chung-Len Lee, Chi Peng Chang, Jwu E. Chen:
A Testing Scheme for Crosstalk Faults Based on the Oscillation Test Signal. Asian Test Symposium 2002: 170-175 - [c22]Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen:
An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits. DATE 2002: 1119 - 2001
- [j9]Jun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Fault Diagnosis for Linear Analog Circuits. J. Electron. Test. 17(6): 483-494 (2001) - [c21]Mill-Jer Wang, R.-L. Jiang, J.-W. Hsia, Chih-Hu Wang, Jwu E. Chen:
Guardband Determination for the Detection of Off-State and Junction Leakages in DRAM Testing. Asian Test Symposium 2001: 151-156 - 2000
- [j8]Wen Ching Wu, Chung-Len Lee, Ming Shae Wu, Jwu E. Chen, Magdy S. Abadir:
Oscillation Ring Delay Test for High Performance Microprocessors. J. Electron. Test. 16(1-2): 147-155 (2000) - [j7]Yeong-Jar Chang, Chung-Len Lee, Jwu E. Chen, Chauchin Su:
A Behavior-Level Fault Model for the Closed-Loop Operational Amplifier. J. Inf. Sci. Eng. 16(5): 751-766 (2000) - [c20]Jun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Fault diagnosis for linear analog circuits. Asian Test Symposium 2000: 25-30 - [c19]Yin-Chao Huang, Chung-Len Lee, Jun-Weir Lin, Jwu E. Chen, Chauchin Su:
A methodology for fault model development for hierarchical linear systems. Asian Test Symposium 2000: 90-95 - [c18]Chih-Wen Lu, Chauchin Su, Chung-Len Lee, Jwu E. Chen:
Is IDDQ testing not applicable for deep submicron VLSI in year 2011? Asian Test Symposium 2000: 338-343 - [c17]Chin-Te Kao, Sam Wu, Jwu E. Chen:
A case study of failure analysis and guardband determination for a 64M-bit DRAM. Asian Test Symposium 2000: 447-
1990 – 1999
- 1999
- [j6]Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen:
A Compiled-Code Parallel Pattern Logic Simulator With Inertial Delay Model. J. Inf. Sci. Eng. 15(6): 885-897 (1999) - [c16]Sheng-Jer Kuo, Chung Len Lee, Soon-Jyh Chang, Jwu E. Chen:
A DFT for semi-DC fault diagnosis for switched-capacitor circuits. ETW 1999: 58-63 - 1998
- [j5]Wen Ching Wu, Chung-Len Lee, Jwu E. Chen:
A Two-Phase Fault Simulation Scheme for Sequential Circuits. J. Inf. Sci. Eng. 14(3): 669-686 (1998) - [c15]Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen:
Maximization of power dissipation under random excitation for burn-in testing. ITC 1998: 567-576 - [c14]Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation. VTS 1998: 341-347 - 1997
- [j4]Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Identifying invalid states for sequential circuit test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(9): 1025-1033 (1997) - [c13]Chih Wei Hu, Chung-Len Lee, Wen Ching Wu, Jwu E. Chen:
Fault diagnosis of odd-even sorting networks. Asian Test Symposium 1997: 288- - [c12]Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen:
Functional test pattern generation for CMOS operational amplifier. VTS 1997: 267-273 - 1996
- [c11]Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Invalid State Identification for Sequential Circuit Test Generation. Asian Test Symposium 1996: 10-15 - [c10]Jwu E. Chen:
Yield Improvement by Test Error Cancellation. Asian Test Symposium 1996: 258-262 - 1995
- [j3]Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Identifying Untestable Faults in Sequential Circuits. IEEE Des. Test Comput. 12(3): 14-23 (1995) - [c9]Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen, Beyin Chen:
Fanout fault analysis for digital logic circuits. Asian Test Symposium 1995: 33-39 - [c8]Wen Ching Wu, Chung-Len Lee, Jwu E. Chen:
Identification of robust untestable path delay faults. Asian Test Symposium 1995: 229- - [c7]Hui Min Wang, Chung-Len Lee, Jwu E. Chen:
Factorization of Multi-Valued Logic Functions. ISMVL 1995: 164-169 - 1994
- [c6]Meng Chiy Lin, Jwu E. Chen, Chung-Len Lee:
TRANS: A Fast and Memory-Efficient Path Delay Fault Simulator. EDAC-ETC-EUROASIC 1994: 508-512 - [c5]Wen Ching Wu, Chung-Len Lee, Jwu E. Chen, Won Yih Lin:
Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning. EDAC-ETC-EUROASIC 1994: 661 - [c4]Hui Min Wang, Chung-Len Lee, Jwu E. Chen:
Algebraic Division for Multilevel Logic Synthesis of Multi-Valued Logic Circuits. ISMVL 1994: 44-51 - [c3]Hui Min Wang, Chung-Len Lee, Jwu E. Chen:
Complete Test Set for Multiple-Valued Logic Networks. ISMVL 1994: 289-296 - 1992
- [c2]Hui Min Wang, Chung-Len Lee, Jwu E. Chen:
Fault Analysis on Two-Level (K+1)-Valued Logic Circuits. ISMVL 1992: 181-188 - 1991
- [j2]Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen:
Checkpoints in irredundant two-level combinational circuits. J. Electron. Test. 2(4): 395-397 (1991) - [j1]Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen:
Single-fault fault-collapsing analysis in sequential logic circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(12): 1559-1568 (1991) - 1990
- [c1]Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen:
Single-fault fault collapsing analysis in sequential logic circuits. ITC 1990: 809-814
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:44 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: