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"Repeated Testing Applications for Improving the IC Test Quality to Achieve ..."

Chung-Huang Yeh, Jwu E. Chen (2019)

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DOI: 10.1007/S10836-019-05812-0

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chung-Huang Yeh, Jwu E. Chen:
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements. J. Electron. Test. 35(4): 459-472 (2019)

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