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26th ETS 2021: Bruges, Belgium
- 26th IEEE European Test Symposium, ETS 2021, Bruges, Belgium, May 24-28, 2021. IEEE 2021, ISBN 978-1-6654-1849-2
- Obi Nnorom, Jalil Morris, Ilias Giechaskiel, Jakub Szefer:
Chill Out: Freezing Attacks on Capacitors and DC/DC Converters. 1-2 - Changming Cui, Junlin Huang:
A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit. 1-2 - Ralf Arnold:
A Tutorial of How to Ensure High Automotive Microcontroller Quality. 1-2 - Wenke Jin, Siqi Lu, Xiaojun Cai:
ESD-PCM: Constructing Reliable Super Dense Phase Change Memory Under Write Disturbance. 1-6 - Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori:
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM. 1-6 - Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos:
BIST-Assisted Analog Fault Diagnosis. 1-6 - Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
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Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. 1-4 - Mohammad Rasoul Roshanshah
Online Testing of a Row-Stationary Convolution Accelerator. 1-2 - Abdullah Ash-Saki, Mahabubul Alam, Koustubh Phalak, Aakarshitha Suresh
A Survey and Tutorial on Security and Resilience of Quantum Computing. 1-10 - Moritz Fieback
Intermittent Undefined State Fault in RRAMs. 1-6 - Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. 1-4 - Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Unsupervised Learning in Test Generation for Digital Integrated Circuits. 1-4 - Vedika Saravanan, Samah Mohamed Saeed:
Test Data-Driven Machine Learning Models for Reliable Quantum Circuit Output. 1-6 - Alberto Bosio, Ian O'Connor, Marcello Traiola
Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*. 1-10 - Sebastian Brandhofer, Simon J. Devitt
ArsoNISQ: Analyzing Quantum Algorithms on Near-Term Architectures. 1-6 - Erik Larsson, Shashi Kiran Gangaraju, Prathamesh Murali:
System-Level Access to On-Chip Instruments. 1-6 - Heba Salem, Nigel P. Topham:
Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnects. 1-2 - Ankush Mamgain, Manuel J. Barragán, Salvador Mir:
Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation. 1-6 - Fotios Vartziotis:
TDMS Test Scheduler: An Integrated Framework for Test Scheduling of DVFS-based SoCs with Multiple Voltage Islands. 1-2 - Sk Subidh Ali
Opacity preserving Countermeasure using Finite State Machines against Differential Scan Attacks. 1-2 - Maria Mushtaq, David Novo, Florent Bruguier, Pascal Benoit, Muhammad Khurram Bhatti:
Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks. 1-2 - Masoomeh Karami
Hierarchical Fault Simulation of Deep Neural Networks on Multi-Core Systems. 1-2 - Fabio Pavanello, Ian O'Connor, Ulrich Rührmair, Amy C. Foster, Dimitris Syvridis:
Recent Advances in Photonic Physical Unclonable Functions. 1-10 - Mohammad Farmani
RHAT: Efficient RowHammer-Aware Test for Modern DRAM Modules. 1-6 - Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim:
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. 1-10 - G. Cardoso Medeiros, Moritz Fieback
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. 1-6 - Guillem Cabo, Francisco Bas, Ruben Lorenzo, David Trilla, Sergi Alcaide
SafeSU: an Extended Statistics Unit for Multicore Timing Interference. 1-4 - Soyed Tuhin Ahmed
NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories. 1-6 - Michail Mavropoulos, Georgios Keramidas, Dimitris Nikolos:
Run Time Management of Faulty Data Caches. 1-6 - Jaume Abella
Security, Reliability and Test Aspects of the RISC-V Ecosystem. 1-10 - Negar Aghapour Sabbagh
Arithmetic Circuit Correction by Adding Optimized Correctors Based on Groebner Basis Computation. 1-6 - Katherine Shu-Min Li, Leon Li-Yang Chen, Ken Chau-Cheung Cheng
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. 1-2 - Syed Farah Naz, Ambika Prasad Shah
Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata. 1-2 - Fin Hendrik Bahnsen, Jan Kaiser
Designing Recurrent Neural Networks for Monitoring Embedded Devices. 1-4 - Teresa L. McLaurin, Frank Frederick, Heath Perry, Shawn Hung, Saurabh Sinha:
Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case Study. 1-4 - Bartosz Grzelak, Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
Convolutional Compaction-Based MRAM Fault Diagnosis. 1-6 - Hua-Ren Li, Hsing-Chung Liang:
GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer. 1-2 - Ioannis Tsounis, Athanasios Papadimitriou, Mihalis Psarakis:
Analyzing the Impact of Approximate Adders on the Reliability of FPGA Accelerators. 1-2 - Francesco Lorenzelli
Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis. 1-6 - Gilad Dar, Avihay Grigiac, David Peled, Yagel Ashkenazi, Menachem Goldzweig, Yoav Weizman, Osnat Keren:
Compact Protection Codes for protecting memory from malicious data and address manipulations. 1-6 - Nicolò Bellarmino, Riccardo Cantoro
Exploiting Active Learning for Microcontroller Performance Prediction. 1-4 - Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre:
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. 1-6 - Sandip Ray, Arani Sinha:
Synergies Between Delay Test and Post-silicon Speed Path Validation: A Tutorial Introduction. 1-4 - S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel
A Plug and Play Digital ABIST Controller for Analog Sensors in Secure Devices. 1-4
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