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"Evaluation of conductive-to-resistive layers interaction in thick-film ..."

Krzysztof Mleczko et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.03.012

access: closed

type: Journal Article

metadata version: 2022-07-27

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Krzysztof Mleczko, Zbigniew Zawislak, Adam Witold Stadler, Andrzej Kolek, Andrzej Dziedzic, Jacek Cichosz:
Evaluation of conductive-to-resistive layers interaction in thick-film resistors. Microelectron. Reliab. 48(6): 881-885 (2008)

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