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"The impact of process-induced mechanical stress in narrow width devices ..."
Naushad Alam, Bulusu Anand, Sudeb Dasgupta (2013)
- Naushad Alam, Bulusu Anand, Sudeb Dasgupta:
The impact of process-induced mechanical stress in narrow width devices and variable-taper CMOS buffer design. Microelectron. Reliab. 53(5): 718-724 (2013)
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