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"The Impact of BEOL Stress on SiGe HBTs at Cryogenic Temperatures."

Jackson P. Moody, Jeffrey W. Teng, John D. Cressler (2023)

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DOI: 10.1109/BCICTS54660.2023.10310868

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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  dblp key:
  - conf/bcicts/MoodyTC23
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  - https://dblp.org/rec/conf/bcicts/MoodyTC23
Jackson P. Moody, Jeffrey W. Teng, John D. Cressler:
The Impact of BEOL Stress on SiGe HBTs at Cryogenic Temperatures. BCICTS 2023: 270-273

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