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Jeffrey W. Teng
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2020 – today
- 2024
- [c13]Mozhgan Hosseinzadeh, Milad Frounchi, George N. Tzintzarov, Jeffrey W. Teng, John D. Cressler:
High-Performance SiGe Heterojunction Phototransistor in a Commercial SiGe BiCMOS Platform for Free-Space Optical Receivers. BCICTS 2024: 18-21 - [c12]Justin P. Heimerl, Jeffrey W. Teng, Harrison P. Lee, Delgermaa Nergui, Jackson P. Moody, John D. Cressler:
TCAD-Based Design of SiGe HBT Germanium Profiles via Bayesian Optimization. BCICTS 2024: 278-281 - [c11]Nelson Sepúlveda-Ramos, Harrison P. Lee, Jeffrey W. Teng, John D. Cressler:
Using Pulsed-Mode Measurements of SiGe HBTs for Non-Destructive, Improved RF-SOA Estimation. BCICTS 2024: 286-289 - [c10]Harrison P. Lee, Delgermaa Nergui, Jeffrey W. Teng
, Jackson P. Moody, Nelson Sepúlveda-Ramos, John D. Cressler:
Anomalous Mixed-Mode Damage Effects in SiGe HBTs at Cryogenic Temperatures. IRPS 2024: 1-4 - 2023
- [c9]Harrison P. Lee, Nelson Sepúlveda-Ramos, Jeffrey W. Teng
The Effects of Carbon Doping on the Performance and Electrical Reliability of SiGe HBTs. BCICTS 2023: 253-256 - [c8]Jackson P. Moody
The Impact of BEOL Stress on SiGe HBTs at Cryogenic Temperatures. BCICTS 2023: 270-273 - 2022
- [c7]Nelson Sepúlveda-Ramos, Jeffrey W. Teng
Improved Electrical Reliability and Performance Enhancements in SiGe HBTs Using Dummy BEOL Metal Layers. BCICTS 2022: 62-65 - [c6]Harrison Lee, Arya Moradinia, Jeffrey W. Teng
Performance vs. Reliability Tradeoffs of Medium Breakdown and High Performance Cascode Amplifier Cells. BCICTS 2022: 66-69 - 2021
- [c5]Harrison P. Lee, Jeffrey W. Teng
Dynamic Behavior of Breakdown Mechanisms in SiGe HBTs. BCICTS 2021: 1-4 - [c4]George N. Tzintzarov, Jeffrey W. Teng, Adrian Ildefonso, John D. Cressler:
Analysis of the Impact of Radiation-Induced Optical Transients on Deep-Space Optical Communications Systems using PPM. OFC 2021: 1-3 - 2020
- [c3]Arya Moradinia, Rafael Perez Martinez, Jeffrey W. Teng
Circuit-Level Safe-Operating-Area of a High-Speed SiGe BiCMOS Wireline Driver. BCICTS 2020: 1-5 - [c2]Hanbin Ying, Sunil G. Rao, Jeffrey W. Teng
Compact Modeling of SiGe HBTs for Design of Cryogenic Control and Readout Circuits for Quantum Computing. BCICTS 2020: 1-4
2010 – 2019
- 2019
- [c1]Hanbin Ying, Jeffrey W. Teng
DC and RF Variability of SiGe HBTs Operating Down to Deep Cryogenic Temperatures. BCICTS 2019: 1-4
Coauthor Index
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