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"Enhancement of resolution in supply current based testing for large ICs."

Yashwant K. Malaiya et al. (1991)

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DOI: 10.1109/VTEST.1991.208173

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/MalaiyaJTM91
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  persistent URL:
  - https://dblp.org/rec/conf/vts/MalaiyaJTM91
Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon:
Enhancement of resolution in supply current based testing for large ICs. VTS 1991: 291-296

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