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Yashwant K. Malaiya
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- affiliation: Colorado State University, USA
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2020 – today
- 2023
- [c69]Robin J. Yeman
, Yashwant K. Malaiya
Comparison of Agile Scaling Frameworks. ICISS 2023: 51-57 - 2021
- [j28]Jim A. Scheibmeir, Yashwant K. Malaiya:
Social media analytics of the Internet of Things. Discov. Internet Things 1(1) (2021) - 2020
- [j27]Peng Xiao
Adaptive Testing Based on Moment Estimation. IEEE Trans. Syst. Man Cybern. Syst. 50(3): 911-922 (2020)
2010 – 2019
- 2019
- [c68]Jim A. Scheibmeir, Yashwant K. Malaiya:
An API Development Model for Digital Twins. QRS Companion 2019: 518-519 - [c67]Jim A. Scheibmeir, Yashwant K. Malaiya:
Quality Model for Testing Augmented Reality Applications. UEMCON 2019: 219-226 - 2017
- [j26]HyunChul Joh, Yashwant K. Malaiya:
Periodicity in software vulnerability discovery, patching and exploitation. Int. J. Inf. Sec. 16(6): 673-690 (2017) - 2016
- [j25]Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray:
Assessing vulnerability exploitability risk using software properties. Softw. Qual. J. 24(1): 159-202 (2016) - [c66]Awad A. Younis, Yashwant K. Malaiya, Charles Anderson
To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Functionwith an Existing Exploit. CODASPY 2016: 97-104 - [c65]Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray:
Evaluating CVSS Base Score Using Vulnerability Rewards Programs. SEC 2016: 62-75 - 2015
- [c64]Awad A. Younis, Yashwant K. Malaiya:
Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System. QRS 2015: 252-261 - 2014
- [j24]HyunChul Joh, Yashwant K. Malaiya:
Modeling Skewness in Vulnerability Discovery. Qual. Reliab. Eng. Int. 30(8): 1445-1459 (2014) - [c63]Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray:
Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability. HASE 2014: 1-8 - [c62]Omar Hussain Alhazmi, Yashwant K. Malaiya:
Are the Classical Disaster Recovery Tiers Still Applicable Today? ISSRE Workshops 2014: 144-145 - [c61]Awad A. Younis, Yashwant K. Malaiya:
Using Software Structure to Predict Vulnerability Exploitation Potential. SERE (Companion) 2014: 13-18 - 2012
- [c60]Omar Hussain Alhazmi
Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. ISSRE Workshops 2012: 19-20 - 2011
- [j23]Sung-Whan Woo, HyunChul Joh, Omar Hussain Alhazmi
Modeling vulnerability discovery process in Apache and IIS HTTP servers. Comput. Secur. 30(1): 50-62 (2011) - 2010
- [c59]Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird:
Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC 2010: 467-476
2000 – 2009
- 2009
- [c58]HyunChul Joh, Yashwant K. Malaiya:
Seasonal Variation in the Vulnerability Discovery Process. ICST 2009: 191-200 - [c57]Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird:
An outlier detection based approach for PCB testing. ITC 2009: 1-10 - 2008
- [j22]Omar Hussain Alhazmi
Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Trans. Reliab. 57(1): 14-22 (2008) - [j21]Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana:
Antirandom Testing: A Distance-Based Approach. VLSI Design 2008: 165709:1-165709:9 (2008) - [c56]HyunChul Joh, Yashwant K. Malaiya:
Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE 2008: 297-298 - [c55]HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya:
Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE 2008: 299-300 - 2007
- [j20]Omar Hussain Alhazmi
Measuring, analyzing and predicting security vulnerabilities in software systems. Comput. Secur. 26(3): 219-228 (2007) - [c54]Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray:
Vulnerability Discovery in Multi-Version Software Systems. HASE 2007: 141-148 - 2006
- [c53]Omar Hussain Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya:
Security vulnerability categories in major software systems. Communication, Network, and Information Security 2006: 138-143 - [c52]Sung-Whan Woo, Omar Hussain Alhazmi
Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC 2006: 103-110 - [c51]Omar Hussain Alhazmi
Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE 2006: 343-352 - [c50]Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya:
X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS 2006: 180-185 - 2005
- [c49]Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya:
Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation 2005: 1088-1095 - [c48]Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray:
Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec 2005: 281-294 - [c47]Omar Hussain Alhazmi
Modeling the Vulnerability Discovery Process. ISSRE 2005: 129-138 - 2004
- [c46]Jiao Chen, Yashwant K. Malaiya:
Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice 2004: 608-614 - 2002
- [j19]Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich:
Software reliability growth with test coverage. IEEE Trans. Reliab. 51(4): 420-426 (2002) - 2000
- [c45]Yashwant K. Malaiya, Jason Denton:
Module Size Distribution and Defect Density. ISSRE 2000: 62-71
1990 – 1999
- 1999
- [c44]Yashwant K. Malaiya, Jason Denton:
Requirements volatility and defect density. ISSRE 1999: 285-294 - 1998
- [c43]Yashwant K. Malaiya, Jason Denton:
Estimating the Number of Residual Defects. HASE 1998: 98-107 - [c42]Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana:
Antirandom vs. pseudorandom testing. ICCD 1998: 221-223 - 1997
- [j18]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong:
Operational and Test Performance in the Presence of Built-in Current Sensors. VLSI Design 5(3): 285-298 (1997) - [c41]Huifang Yin, Zemen Lebne-Dengel, Yashwant K. Malaiya:
Automatic test generation using checkpoint encoding and antirandom testing. ISSRE 1997: 84-95 - [c40]Yashwant K. Malaiya, Jason Denton:
What do the software reliability growth model parameters represent? ISSRE 1997: 124-135 - [c39]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using IDDQ Testing in BiCMOS and CMOS Circuits. VLSI Design 1997: 545-546 - 1996
- [j17]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design 4(3): 231-242 (1996) - [c38]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI 1996: 214-219 - [c37]Michael Naixin Li, Yashwant K. Malaiya:
Fault exposure ratio estimation and applications. ISSRE 1996: 372-381 - 1995
- [j16]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman:
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30(8): 855-863 (1995) - [c36]Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon:
A Novel High-Speed BiCMOS Domino Logic Family. ISCAS 1995: 21-24 - [c35]Yashwant K. Malaiya:
Antirandom testing: getting the most out of black-box testing. ISSRE 1995: 86-95 - [c34]Michael Naixin Li, Yashwant K. Malaiya:
ROBUST: a next generation software reliability engineering tool. ISSRE 1995: 375-380 - [c33]Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana:
Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN 1995: 150-157 - 1994
- [j15]Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon:
Resolution Enhancement in IDDQ Testing for Large ICs. VLSI Design 1(4): 277-284 (1994) - [c32]Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe:
The relationship between test coverage and reliability. ISSRE 1994: 186-195 - [c31]Michael Naixin Li, Yashwant K. Malaiya:
On input profile selection for software testing. ISSRE 1994: 196-205 - [c30]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong:
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design 1994: 187-190 - [c29]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Input pattern classification for transistor level testing of BiCMOS circuits. VTS 1994: 457-462 - 1993
- [j14]Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani:
An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. 19(11): 1087-1094 (1993) - [j13]W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana:
Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 1(4): 446-452 (1993) - [c28]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Test Generation for BiCMOS Circuits. ISCAS 1993: 1987-1990 - [c27]Michael Naixin Li, Yashwant K. Malaiya:
Enhancing accuracy of software reliability prediction. ISSRE 1993: 71-79 - [c26]Kang Wu, Yashwant K. Malaiya:
The effect of correlated faults on software reliability. ISSRE 1993: 80-89 - [c25]Anneliese von Mayrhauser, Yashwant K. Malaiya, Pradip K. Srimani, James Keables:
On the need for simulation for better characterization of software reliability. ISSRE 1993: 264-273 - [c24]W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana:
Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design 1993: 118-123 - [c23]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Testable design for BiCMOS stuck-open fault detection. VTS 1993: 296-302 - 1992
- [j12]Yashwant K. Malaiya:
Guest Editor's Introduction: VLSI Design 92. IEEE Des. Test Comput. 9(4): 4-5 (1992) - [j11]Pradip K. Srimani, Yashwant K. Malaiya:
Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Softw. 9(4): 10-12 (1992) - [j10]Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya:
Using Neural Networks in Reliability Prediction. IEEE Softw. 9(4): 53-59 (1992) - [j9]Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya:
Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. 18(7): 563-574 (1992) - [c22]Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani:
The nature of fault exposure ratio. ISSRE 1992: 23-32 - [c21]Nachimuthu Karunanithi, Yashwant K. Malaiya:
The scaling problem in neural networks for software reliability prediction. ISSRE 1992: 76-82 - [c20]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
On Bridging Faults in ECL Circuits. VLSI Design 1992: 55-60 - [c19]Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana:
Behavior of faulty single BJT BiCMOS logic gates. VTS 1992: 315-320 - 1991
- [j8]Yinghua Min, Yashwant K. Malaiya, Boping Jin:
Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40(9): 1075-1081 (1991) - [c18]Yashwant K. Malaiya, Pradip K. Srimani:
An Introduction to Software Reliability Models. Int. CMG Conference 1991: 1237-1239 - [c17]Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Gate level representation of ECL circuits for fault modeling. Great Lakes Symposium on VLSI 1991: 330-331 - [c16]Nachimuthu Karunanithi, Yashwant K. Malaiya, L. Darrell Whitley:
Prediction of software reliability using neural networks. ISSRE 1991: 124-130 - [c15]Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park:
An analysis and testing of operation induced faults in MOS VLSI. VTS 1991: 137-142 - [c14]Sheng Feng, Yashwant K. Malaiya:
Evaluation of detectability in BIST environment. VTS 1991: 271-276 - [c13]Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon:
Enhancement of resolution in supply current based testing for large ICs. VTS 1991: 291-296 - [e1]Yashwant K. Malaiya:
Proceedings of the 24th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 24, Albuquerque, New Mexico, USA, November 18-20, 1991. ACM/IEEE 1991, ISBN 0-89791-460-0 [contents] - 1990
- [c12]Yashwant K. Malaiya, Nachimuthu Karunanithi, Pradeep Verma:
Predictability measures for software reliability models. COMPSAC 1990: 7-12 - [c11]Suntae Hwang, Rochit Rajsuman, Yashwant K. Malaiya:
On the testing of microprogrammed processor. MICRO 1990: 260-266
1980 – 1989
- 1989
- [j7]Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana:
CMOS stuck-open fault testability. IEEE J. Solid State Circuits 24(1): 193-194 (1989) - [j6]Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya:
CMOS open-fault detection in the presence of glitches and timing skews. IEEE J. Solid State Circuits 24(4): 1055-1061 (1989) - [j5]Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana:
Limitations of switch level analysis for bridging faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(7): 807-811 (1989) - [c10]Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya:
CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC 1989: 714-717 - [c9]Yashwant K. Malaiya:
On inherent untestability of unaugmented microprogrammed control. MICRO 1989: 88-96 - 1988
- [c8]Yashwant K. Malaiya, Sheng Feng:
Design of a testable RISC-to-CISC control architecture. MICRO 1988: 57-59 - 1987
- [c7]Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana:
On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC 1987: 244-250 - 1985
- [c6]Yashwant K. Malaiya:
Faults in Microprogrammed and Hardwired Control. ITC 1985: 732 - 1984
- [j4]Yashwant K. Malaiya, Ramesh Narayanaswamy:
Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. IEEE Des. Test 1(4): 62-74 (1984) - [c5]Yashwant K. Malaiya, Shoubao Yang:
The Coverage Problem for Random Testing. ITC 1984: 237-245 - 1983
- [c4]Yashwant K. Malaiya, Ramesh Narayanaswamy:
Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC 1983: 560-573 - 1982
- [c3]Yashwant K. Malaiya, Stephen Y. H. Su:
A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34 - 1981
- [j3]Yashwant K. Malaiya, Stephen Y. H. Su:
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30(8): 600-604 (1981) - [j2]Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya:
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981) - [c2]Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya:
State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446
1970 – 1979
- 1979
- [c1]Yashwant K. Malaiya, Stephen Y. H. Su:
A survey of methods for intermittent fault analysis. MARK 1979: 577-586 - 1978
- [j1]Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya:
A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27(6): 567-570 (1978)
Coauthor Index
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