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"Analysis of large area Trench-IGBT current distribution under UIS test ..."

Michele Riccio et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.072

access: closed

type: Journal Article

metadata version: 2023-12-01

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Michele Riccio, Lucio Rossi, Andrea Irace, Ettore Napoli, Giovanni Breglio, Paolo Spirito, Ryuzo Tagami, Yoshihito Mizuno:
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. Microelectron. Reliab. 50(9-11): 1725-1730 (2010)

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