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Ryuzo Tagami

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2010 – 2019

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2012
[j2]
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  - journals/mr/IwahashiMHTI12
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  - https://dblp.org/rec/journals/mr/IwahashiMHTI12
Yohei Iwahashi, Yoshihito Mizuno, Masafumi Hara, Ryuzo Tagami, Masanori Ishigaki:
Analysis of current distribution on IGBT under unclamped inductive switching conditions. Microelectron. Reliab. 52(9-10): 2431-2434 (2012)
2010
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Michele Riccio, Lucio Rossi, Andrea Irace, Ettore Napoli, Giovanni Breglio, Paolo Spirito, Ryuzo Tagami, Yoshihito Mizuno:
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. Microelectron. Reliab. 50(9-11): 1725-1730 (2010)

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