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"Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based ..."

Mutsuo Daito et al. (2011)

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DOI: 10.1109/JSSC.2011.2160790

access: closed

type: Journal Article

metadata version: 2020-08-30

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  - https://dblp.org/rec/journals/jssc/DaitoNSGKKIIKTS11
Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai:
Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing. IEEE J. Solid State Circuits 46(10): 2386-2395 (2011)

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