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Yoshio Komoto

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2010 – 2019

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2011
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  - journals/jssc/DaitoNSGKKIIKTS11
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Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai:
Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing. IEEE J. Solid State Circuits 46(10): 2386-2395 (2011)
2010
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Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai:
Capacitively coupled non-contact probing circuits for membrane-based wafer-level simultaneous testing. ISSCC 2010: 144-145

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