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"Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells ..."

Trang Le Dinh Dang et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128910

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-04

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  dblp key:
  - conf/irps/DangLDMKCH20
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  - https://dblp.org/rec/conf/irps/DangLDMKCH20
Trang Le Dinh Dang, Trinh Dinh Linh, Ngyuen Thanh Dat, Changhong Min, Jinsang Kim, Ik-Joon Chang, Jin-Woo Han:
Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro. IRPS 2020: 1-5

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