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Jaehoon Song
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2020 – today
- 2023
- [j6]Peixi Sun, Yixuan Wang, Jaehoon Song:
Enhanced TODIM method based on VIKOR for interval neutrosophic MAGDM and applications to brand competitiveness evaluation of manufacturing enterprises. J. Intell. Fuzzy Syst. 45(6): 11021-11034 (2023)
2010 – 2019
- 2011
- [c8]Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park:
Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. Asian Test Symposium 2011: 335-340
2000 – 2009
- 2009
- [j5]Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(1): 56-60 (2009) - [j4]Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(3): 554-565 (2009) - [j3]Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park:
Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Circuits Syst. II Express Briefs 56-II(5): 419-423 (2009) - 2008
- [j2]Hyunbean Yi, Jaehoon Song, Sungju Park:
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57(5): 1071-1078 (2008) - [c7]Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park:
An Efficient Secure Scan Design for an SoC Embedding AES Core. ITC 2008: 1 - 2007
- [c6]Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park:
An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips. Asia-Pacific Computer Systems Architecture Conference 2007: 139-150 - [c5]Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park:
Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC. ATS 2007: 193-198 - [c4]Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park:
Design of Test Access Mechanism for AMBA-Based System-on-a-Chip. VTS 2007: 375-380 - 2006
- [j1]Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park:
Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(11): 2605-2608 (2006) - [c3]Hyunbean Yi, Jaehoon Song, Sungju Park:
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains. ITC 2006: 1-7 - 2005
- [c2]Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park:
Hybrid test data compression technique for SOC scan testing. SoCC 2005: 69-72 - 2002
- [c1]Jaehoon Song, Sungju Park:
A Simple Wrapped Core Linking Module for SoC Test Access. Asian Test Symposium 2002: 344-349
Coauthor Index
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