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"Low-Cost Scan Test for IEEE-1500-Based SoC."

Hyunbean Yi, Jaehoon Song, Sungju Park (2008)

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DOI: 10.1109/TIM.2007.911699

access: closed

type: Journal Article

metadata version: 2020-06-08

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Hyunbean Yi, Jaehoon Song, Sungju Park:
Low-Cost Scan Test for IEEE-1500-Based SoC. IEEE Trans. Instrum. Meas. 57(5): 1071-1078 (2008)

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