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Gerard Coquery
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2010 – 2019
- 2018
- [c4]Stéphane Laporte, Gérard Coquery, Marc Revilloud, Virginie Deniau
:
Experimental performance assessment of a dynamic wireless power transfer system for future EV in real driving conditions. e-Energy 2018: 570-578 - 2017
- [j11]Philippe Pougnet, Gerard Coquery, Richard Lallemand, A. Makhloufi:
Power module thermal cycling tester for in-situ ageing detection. Microelectron. Reliab. 76-77: 544-548 (2017) - 2014
- [j10]Mohamed Ayadi, Olivier Briat
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test. Microelectron. Reliab. 54(9-10): 1944-1948 (2014) - [c3]Mohamed Ayadi, Olivier Briat
Influence of thermal cycling on supercapacitor performance fading during ageing test at constant voltage. ISIE 2014: 1823-1828 - [c2]Mahraz Bendali, Chérif Larouci
Reliability assesment in the design of interleaved converters under multi-physical constraints. ISIE 2014: 2117-2121 - 2013
- [j9]Mohamed Ayadi
Thermal cycling impacts on supercapacitor performances during calendar ageing. Microelectron. Reliab. 53(9-11): 1628-1631 (2013) - [j8]Abdelfatah Kolli, Olivier Bethoux
Space-Vector PWM Control Synthesis for an H-Bridge Drive in Electric Vehicles. IEEE Trans. Veh. Technol. 62(6): 2441-2452 (2013) - [c1]Mahraz Bendali, Chérif Larouci
Design methodology with optimization of an interleaved buck converter for automotive application. EUROCON 2013: 1066-1072 - 2011
- [j7]Y. Celnikier, Lahouari Benabou, Laurent Dupont
Investigation of the heel crack mechanism in Al connections for power electronics modules. Microelectron. Reliab. 51(5): 965-974 (2011) - [j6]Y. Celnikier, Laurent Dupont
Optimization of wire connections design for power electronics. Microelectron. Reliab. 51(9-11): 1892-1897 (2011) - 2010
- [j5]Laurent Dupont
Experimental and numerical results correlation during extreme use of power MOSFET designed for avalanche functional mode. Microelectron. Reliab. 50(9-11): 1804-1809 (2010) - [j4]A. Hammar, Pascal Venet, Richard Lallemand, Gerard Coquery, Gérard Rojat:
Study of Accelerated Aging of Supercapacitors for Transport Applications. IEEE Trans. Ind. Electron. 57(12): 3972-3979 (2010)
2000 – 2009
- 2009
- [j3]Laurent Dupont
Accelerated active ageing test on SiC JFETs power module with silver joining technology for high temperature application. Microelectron. Reliab. 49(9-11): 1375-1380 (2009) - 2003
- [j2]Gerard Coquery, Guy Lefranc, T. Licht, Richard Lallemand, Norbert Seliger
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. Microelectron. Reliab. 43(9-11): 1871-1876 (2003) - 2001
- [j1]Gerard Coquery, S. Carubelli, Jean-Pierre Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Philippe Dupuy:
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter. Microelectron. Reliab. 41(9-10): 1695-1700 (2001)
Coauthor Index
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