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Thomas Rueckes
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2020 – today
- 2022
- [c6]James Farmer, Dmitry Veksler, E. Tang, Gennadi Bersuker, David Z. Gao, Al-Moatasem El-Sayed, Thomas Durrant, Alexander L. Shluger, Thomas Rueckes, Lee Cleveland, Harry Luan, Rahul Sen:
Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics. IRPS 2022: 36-1 - 2021
- [c5]Hitoshi Saito, Jun'ichi Watanabe, J. Seino, Tetsuro Tamura, Naoya Sashida, Kota Hara, Kuninori Kawabata, Atsushi Fujii, Jun Ohno, Atsushi Nakakubo, Manabu Kojima, T. Shimoyama, H. Wada, Lee Cleveland, H. Luan, R. Sen, N. Leong, T. Gallagher, Thomas Rueckes:
Development of 16 Mb NRAM Aiming for High Reliability, Small Cell Area, and High Switching Speed. IMW 2021: 1-4 - [c4]James Farmer, William Whitehead, Andrew Hall, Dmitry Veksler, Gennadi Bersuker, David Z. Gao, Al-Moatasem El-Sayed, Thomas Durrant, Alexander L. Shluger, Thomas Rueckes, Lee Cleveland, Harry Luan, Rahul Sen:
Mitigating switching variability in carbon nanotube memristors. IRPS 2021: 1-4 - 2020
- [c3]Dmitry Veksler, Gennadi Bersuker, Adam W. Bushmaker, Maribeth Mason, P. R. Shrestha, Kin P. Cheung, Jason P. Campbell, Thomas Rueckes, Lee Cleveland, Harry Luan, David C. Gilmer:
Memory update characteristics of carbon nanotube memristors (NRAM®) under circuitry-relevant operation conditions. IRPS 2020: 1-4
2010 – 2019
- 2017
- [c2]David C. Gilmer, Thomas Rueckes, Lee Cleveland, Darlene Viviani:
NRAM status and prospects. ICICDT 2017: 1-4 - 2016
- [j1]Sheyang Ning, Tomoko Ogura Iwasaki, Shuhei Tanakamaru, Darlene Viviani, Henry Huang, Monte Manning, Thomas Rueckes, Ken Takeuchi:
Reset-Check-Reverse-Flag Scheme on NRAM With 50% Bit Error Rate or 35% Parity Overhead and 16% Decoding Latency Reductions for Read-Intensive Storage Class Memory. IEEE J. Solid State Circuits 51(8): 1938-1951 (2016) - 2010
- [c1]Glen Rosendale, Sohrab Kianian, Monte Manning, Darlene Hamilton, Henry Huang, Karl Robinson, Young Weon Kim, Thomas Rueckes:
A 4 Megabit Carbon Nanotube-based nonvolatile memory (NRAM). ESSCIRC 2010: 478-481
Coauthor Index
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