• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 59 matches

• 2016
• 
  Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
  Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS 2016: 1-6
• 
  Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser:
  Thermal issues in test: An overview of the significant aspects and industrial practice. VTS 2016: 1-4
• 
  Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard:
  Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. VTS 2016: 1
• 
  Suvadeep Banerjee, Suriyaprakash Natarajan:
  Infant mortality tests for analog and mixed-signal circuits. VTS 2016: 1-6
• 
  Alan Becker:
  Short burst software transparent on-line MBIST. VTS 2016: 1-6
• 
  Bonita Bhaskaran, Amit Sanghani, Kaushik Narayanun, Ayub Abdollahian, Amit Laknaur:
  Test method and scheme for low-power validation in modern SOC integrated circuits. VTS 2016: 1-6
• 
  Dilip Bhavsar, Michael Lohmiller, Pankaj Pant:
  Lateral coupling faults in multi-ported register files and methods for their testing. VTS 2016: 1-6
• 
  Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman:
  Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. VTS 2016: 1-6
• 
  Cristiana Bolchini:
  Runtime resource management for lifetime extension in multi-core systems. VTS 2016: 1
• 
  Pankaj Bongale, Vinothkumar Sundaresan, Partha Ghosh, Rubin A. Parekhji:
  A novel technique for interdependent trim code optimization. VTS 2016: 1-6
• 
  Hari Chauhan, Marvin Onabajo:
  Performance enhancement techniques and verification methods for radio frequency circuits and systems. VTS 2016: 1-4
• 
  Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
  Adaptive testing of analog/RF circuits using hardware extracted FSM models. VTS 2016: 1-6
• 
  Nikos Foutris, Athanasios Chatzidimitriou, Dimitris Gizopoulos, John Kalamatianos, Vilas Sridharan:
  Faults in data prefetchers: Performance degradation and variability. VTS 2016: 1-6
• 
  Bonnie Lynne Gray:
  Active polymers for bio medical microdevices and microfluidic systems. VTS 2016: 1
• 
  Kevin Greene, Vikas Chauhan, Brian A. Floyd:
  Code-modulated embedded test for phased arrays. VTS 2016: 1-4
• 
  Stavros Hadjitheophanous, Stelios N. Neophytou, Maria K. Michael:
  Scalable parallel fault simulation for shared-memory multiprocessor systems. VTS 2016: 1-6
• 
  Jie Han:
  Introduction to approximate computing. VTS 2016: 1
• 
  Omar Al-Terkawi Hasib, Yvon Savaria, Claude Thibeault:
  WeSPer: A flexible small delay defect quality metric. VTS 2016: 1-6
• 
  Muhammad Ruhul Hasin, Jennifer Kitchen:
  Post fabrication tuning of GaN based RF power amplifiers for pico-cell applications. VTS 2016: 1-4
• 
  Miao Tony He, Gustavo K. Contreras, Mark M. Tehranipoor, Dat Tran, LeRoy Winemberg:
  Test-point insertion efficiency analysis for LBIST applications. VTS 2016: 1-6
• 
  Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
  Process independent gain measurement with low overhead via BIST/DUT co-design. VTS 2016: 1-6
• 
  Dae Hyun Kim, Linda S. Milor:
  ECC-ASPIRIN: An ECC-assisted post-package repair scheme for aging errors in DRAMs. VTS 2016: 1-6
• 
  Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio:
  Cache- and register-aware system reliability evaluation based on data lifetime analysis. VTS 2016: 1-6
• 
  Yu-Ting Li, Yong-Xiao Chen, Jin-Fu Li:
  Fault modeling and testing of resistive nonvolatile-8T SRAMs. VTS 2016: 1-6
• 
  Jain-De Li, Sying-Jyan Wang, Katherine Shu-Min Li, Tsung-Yi Ho:
  Test and diagnosis of paper-based microfluidic biochips. VTS 2016: 1-6
• 
  Bodhisatwa Mazumdar, Samah Mohamed Saeed, Sk Subidh Ali, Ozgur Sinanoglu:
  Thwarting timing attacks on NEMS relay based designs. VTS 2016: 1-4
• 
  Antonio Miele:
  Lifetime reliability modeling and estimation in multi-core systems. VTS 2016: 1
• 
  Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
  Real-time DC motor error detection and control compensation using linear checksums. VTS 2016: 1-6
• 
  Suriyaprakash Natarajan, Li-C. Wang:
  Session 4B - Panel data analytics in semiconductor manufacturing. VTS 2016: 1
• 
  Srinivasa Shashank Nuthakki, Rajit Karmakar, Santanu Chattopadhyay, Krishnendu Chakrabarty:
  Optimization of the IEEE 1687 access network for hybrid access schedules. VTS 2016: 1-6

skipping 29 more matches