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Jae Woong Jeong
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2010 – 2019
- 2019
- [j3]Jae Woong Jeong
, Jennifer Kitchen
On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration. IEEE Des. Test 36(3): 117-125 (2019) - 2017
- [j2]Jae Woong Jeong, Vishwanath Natarajan, Shreyas Sen, T. M. Mak, Jennifer Kitchen, Sule Ozev:
A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources. ACM Trans. Design Autom. Electr. Syst. 23(1): 2:1-2:21 (2017) - [c12]Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev:
Built-in self-test for stability measurement of low dropout regulator. ITC 2017: 1-9 - [c11]Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev:
Evaluation of loop transfer function based dynamic testing of LDOs. ITC-Asia 2017: 14-19 - [c10]Jae-Yun Jeong, Jae Woong Jeong:
Advanced Data Communication Framework for Cloud Computing from CDMI. MUE/FutureTech 2017: 18-23 - [c9]Min-Gyu Shim, Jae Woong Jeong:
A Study of AI Based E-learning System and Application. MUE/FutureTech 2017: 24-30 - [c8]Junhak Lee, Jae Woong Jeong:
A Study on the Serious Issues in the Practice of Information Security in IT: With a Focus on Ransomware. MUE/FutureTech 2017: 31-36 - 2016
- [j1]Jae Woong Jeong, Afsaneh Nassery, Jennifer N. Kitchen, Sule Ozev:
Built-In Self-Test and Digital Calibration of Zero-IF RF Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2286-2298 (2016) - [c7]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
Process independent gain measurement with low overhead via BIST/DUT co-design. VTS 2016: 1-6 - 2015
- [c6]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
Robust amplitude measurement for RF BIST applications. ETS 2015: 1-6 - [c5]Jae Woong Jeong, Jennifer Kitchen, Sule Ozev:
A self-compensating built-in self-test solution for RF phased array mismatch. ITC 2015: 1-9 - 2014
- [c4]Jae Woong Jeong, Sule Ozev, Shreyas Sen, Vishwanath Natarajan, Mustapha Slamani:
Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. DATE 2014: 1-6 - [c3]Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao:
Development and empirical verification of an accuracy model for the power down leakage tests. VTS 2014: 1-6 - 2013
- [c2]Afsaneh Nassery, Jae Woong Jeong, Sule Ozev:
Zero-overhead self test and calibration of RF transceivers. ITC 2013: 1-9 - [c1]Jae Woong Jeong, Sule Ozev, Shreyas Sen, T. M. Mak:
Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters. VTS 2013: 1-6
Coauthor Index
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