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"Electromigration Test Chip Experiments from Realistic Power Grid ..."

Yong Hyeon Yi et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529449

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  dblp key:
  - conf/irps/YiKKVMS24
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  - https://dblp.org/rec/conf/irps/YiKKVMS24
Yong Hyeon Yi, Chris H. Kim, Armen Kteyan, Alexander Volkov, Stéphane Moreau, Valeriy Sukharev:
Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis. IRPS 2024: 1-6

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