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"Interconnect reliability modeling and analysis for multi-branch ..."

Hai-Bao Chen et al. (2015)

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DOI: 10.1145/2744769.2747953

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim:
Interconnect reliability modeling and analysis for multi-branch interconnect trees. DAC 2015: 90:1-90:6

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