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Kazuki Monta
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Journal Articles
- 2023
- [j2]Kazuki Monta
, Lang Lin
Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis. ACM J. Emerg. Technol. Comput. Syst. 19(1): 9:1-9:23 (2023) - 2022
- [j1]Kazuki Monta
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements. IEEE Des. Test 39(5): 79-87 (2022)
Conference and Workshop Papers
- 2024
- [c9]Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata:
On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. COSADE 2024: 22-37 - [c8]Takuya Wadatsumi, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Lang Lin, Norman Chang, Makoto Nagata:
Modeling and Analysis of On-Chip Voltage Fluctuations Caused by Electromagnetic Fault Injection. EMC Compo 2024: 1-4 - [c7]Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata:
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips. FDTC 2024: 44-52 - [c6]Henian Li, Lang Lin, Norman Chang, Sreeja Chowdhury, Dylan Mcguire, Bozidar Novakovic, Kazuki Monta, Makoto Nagata, Ying-Shiun Li, Pramod M. S, Piin-Chen Yeh, Jyh-Shing Roger Jang, Chengjie Xi, Qiutong Jin, Navid Asadi, Mark M. Tehranipoor:
Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation. HOST 2024: 107-111 - 2023
- [c5]Kazuki Monta, Makoto Nagata, Josep Balasch, Ingrid Verbauwhede
On the Unpredictability of SPICE Simulations for Side-Channel Leakage Verification of Masked Cryptographic Circuits. DAC 2023: 1-6 - [c4]Takuya Wadatsumi
Characterization of Backside ESD Impacts on Integrated Circuits. IRPS 2023: 1-6 - 2021
- [c3]Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. ETS 2021: 1-4 - [c2]Lang Lin, Deqi Zhu, Jimin Wen, Hua Chen, Yu Lu, Norman Chang, Calvin Chow, Harsh Shrivastav, Chia-Wei Chen, Kazuki Monta, Makoto Nagata:
Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification. HOST 2021: 270-280 - 2020
- [c1]Lang Lin, Dinesh Selvakumaran, Deqi Zhu, Norman Chang, Calvin Chow, Makoto Nagata
Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis. iSES 2020: 133-138
Coauthor Index
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