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"On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si ..."

Rikuu Hasegawa et al. (2024)

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DOI: 10.1007/978-3-031-57543-3_2

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-15

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  dblp key:
  - conf/cosade/HasegawaMWMN24
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  - https://dblp.org/rec/conf/cosade/HasegawaMWMN24
Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata:
On-Chip Evaluation of Voltage Drops and Fault Occurrence Induced by Si Backside EM Injection. COSADE 2024: 22-37

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