default search action
Magali Bastian
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2000 – 2009
- 2009
- [j5]Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. 17(10): 1556-1559 (2009) - [c17]Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin:
A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348 - 2008
- [c16]Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
, Magali Bastian, Vincent Gouin:
A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485 - [c15]Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert:
A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. DELTA 2008: 107-110 - [c14]Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert:
Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI 2008: 310-315 - [c13]Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC 2008: 1-10 - [c12]Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin:
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94 - 2007
- [j4]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electron. Test. 23(5): 435-444 (2007) - [c11]Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel
Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. ATS 2007: 507-510 - [c10]Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel
Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533 - [c9]Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ETS 2007: 97-104 - [c8]Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368 - 2006
- [j3]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electron. Test. 22(3): 287-296 (2006) - [c7]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261 - 2005
- [j2]Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electron. Test. 21(2): 169-179 (2005) - [j1]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electron. Test. 21(5): 551-561 (2005) - [c6]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862 - [c5]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization. ETS 2005: 116-121 - [c4]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188 - 2004
- [c3]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271 - [c2]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. ETS 2004: 140-145 - 2003
- [c1]Simone Borri, Magali Hage-Hassan, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Defect-oriented dynamic fault models for embedded-SRAMs. ETW 2003: 23-28
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:44 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by: