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Luca Larcher
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2020 – today
- 2024
- [c41]Bastien Beltrando, Marco A. Villena, Mondol Anik Kumar, Shruba Gangopadhyay, Deepak Kamalanathan, E. Smith, Nasrin Kazem, Ghazal Saheli, Stephen Weeks, Michael Haverty, Muthukumar Kaliappan, Andrea Padovani, S. Krishnan, Jeffrey W. Anthis, Luca Larcher, Milan Pesic:
Self-rectifying non-volatile tunneling synapse: multiscale modeling augmented development. IMW 2024: 1-4 - [c40]Tommaso Rollo, Hansel Lo, Luca Larcher, Christopher Olsen, Milan Pesic:
Blocking Oxide Material Engineering to Improve Retention Loss in 3D NAND: a Modeling Process Optimization Study. IRPS 2024: 1-5 - [c39]Bastien Beltrando, Bruno Coppolelli, Jung-Bae Kim, Yang Ho Bae, Stephen Weeks, Lisa Enman, Ghazal Saheli, Davide Cornigli, Stuart Brinkley, Mark Saly, Luca Larcher, Dong Kil Yim, Milan Pesic:
Low-PBTS defect-engineered high-mobility metal-oxide BEOL transistors. IRPS 2024: 4 - [c38]Andrea Palmieri, Mahdi Tavakoli, Chi Ching, Wenkai Zheng, Shi You, Xiaodong Zhang, Davide Cornigli, Michael Haverty, Navneet Singh, Luca Larcher, Monika Jamieson, Ajay Bhatnagar, Alexander Jansen, Max Gage, Jianshe Tang, Sameer Deshpande, Brian Brown, Arun Srivatsa, Mehul Naik, Bo Xie, Jerry Gelatos, Joung Joo Lee, Xianmin Tang, Gaurav Thareja, Milan Pesic:
Characterization and Multiscale Modeling of TDDB in State-of-the-art BEOL. IRPS 2024: 10 - 2023
- [c37]Andrea Padovani, Paolo La Torraca, Jack Strand, Alexander L. Shluger, Valerio Milo, Luca Larcher:
Towards a Universal Model of Dielectric Breakdown. IRPS 2023: 1-8 - [c36]Milan Pesic, Bastien Beltrando, Tommaso Rollo, Cristian Zambelli, Andrea Padovani, Rino Micheloni, Rita Maji, Lisa Enman, Mark Saly, Yang Ho Bae, Jung-Bae Kim, Dong Kil Yim, Luca Larcher:
Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND. IRPS 2023: 1-8 - 2022
- [c35]Milan Pesic, Andrea Padovani, Tommaso Rollo, Bastien Beltrando, Jack Strand
, Parnika Agrawal, Alexander L. Shluger, Luca Larcher:
Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents. IMW 2022: 1-4 - [c34]Andrea Padovani, Milan Pesic, Federico Nardi
Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited). IRPS 2022: 3 - [c33]Milan Pesic, Bastien Beltrando, Andrea Padovani, Toshihiko Miyashita, Nam-Sung Kim, Luca Larcher:
Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation. IRPS 2022: 4 - 2021
- [c32]Milan Pesic, Bastien Beltrando, Andrea Padovani
Variability sources and reliability of 3D - FeFETs. IRPS 2021: 1-7
2010 – 2019
- 2019
- [c31]Andrea Padovani
Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers. IRPS 2019: 1-8 - 2018
- [c30]Alessandro Bertacchini, Marco Lasagni, Gabriele Sereni, Luca Larcher, Paolo Pavan
Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting. IECON 2018: 4213-4218 - [c29]Andrea Padovani, Luca Larcher:
Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics: Insights from a multi-scale modeling approach. IRPS 2018: 3 - [c28]David Z. Gao, Jack Strand
Role of electron and hole trapping in the degradation and breakdown of SiO2 and HfO2 films. IRPS 2018: 5 - 2017
- [j12]Mouhamad Alayan
Correlated Effects on Forming and Retention of Al Doping in HfO2-Based RRAM. IEEE Des. Test 34(3): 23-30 (2017) - [c27]Francesco Maria Puglisi
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design. ESSDERC 2017: 204-207 - [c26]Andrea Padovani
A multiscale modeling approach for the simulation of OxRRAM devices. NVMTS 2017: 1-8 - 2016
- [j11]Francesco Maria Puglisi
Bipolar Resistive RAM Based on HfO2: Physics, Compact Modeling, and Variability Control. IEEE J. Emerg. Sel. Topics Circuits Syst. 6(2): 171-184 (2016) - [j10]Alessandro Bertacchini, Giacomantonio Napoletano, Stefano Scorcioni, Luca Larcher, Paolo Pavan
System With RF Power Delivery Capabilities for Active Safety Enhancement in Industrial Vehicles Using Interchangeable Implements. IEEE Trans. Intell. Transp. Syst. 17(12): 3471-3483 (2016) - [c25]Francesco Maria Puglisi
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization. ESSDERC 2016: 252-255 - [c24]Alessandro Bertacchini, Luca Larcher:
Wireless sensor systems with energy harvesting capabilities for safety enhancement in agricultural vehicles. ICIT 2016: 1950-1955 - [c23]Marco Lasagni, Paolo Pavan
Force impact effect in contact-mode triboelectric energy harvesters: Characterization and modeling. IEEE SENSORS 2016: 1-3 - [c22]Luca Larcher, Francesco Maria Puglisi
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. PATMOS 2016: 128-132 - [c21]Luca Larcher, Francesco Maria Puglisi
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials. PATMOS 2016: 296-300 - 2015
- [c20]Francesco Maria Puglisi
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory. ESSDERC 2015: 270-273 - [c19]G. Sereni, Luca Vandelli, Roberto Cavicchioli
Substrate and temperature influence on the trap density distribution in high-k III-V MOSFETs. IRPS 2015: 2 - [c18]Francesco Maria Puglisi
A microscopic physical description of RTN current fluctuations in HfOx RRAM. IRPS 2015: 5 - 2014
- [c17]Francesco Maria Puglisi
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS. ESSDERC 2014: 246-249 - [c16]Alessandro Bertacchini
Active safety system with RF energy harvesting capabilities for industrial applications using interchangeable implements. IECON 2014: 5286-5292 - 2013
- [j9]Andrea Padovani
Compact modeling of TANOS program/erase operations for SPICE-like circuit simulations. Microelectron. J. 44(1): 50-57 (2013) - [c15]Gennadi Bersuker, Brian Butcher, David Gilmer, Paul Kirsch, Luca Larcher
Connecting RRAM performance to the properties of the hafnia-based dielectrics. ESSDERC 2013: 163-165 - [c14]Francesco Maria Puglisi
Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS. ESSDERC 2013: 166-169 - [c13]Francesco Maria Puglisi
A compact model of hafnium-oxide-based resistive random access memory. ICICDT 2013: 85-88 - 2012
- [c12]Stefano Scorcioni, Alessandro Bertacchini
A 868MHz CMOS RF-DC power converter with -17dBm input power sensitivity and efficiency higher than 40% over 14dB input power range. ESSCIRC 2012: 109-112 - [c11]Francesco Maria Puglisi
Random Telegraph Signal noise properties of HfOx RRAM in high resistive state. ESSDERC 2012: 274-277 - [c10]Denis Dondi, Alessandro Bertacchini
Enhancing safety in vehicles with implement or trailer using an autonomous wireless sensor network system. ICVES 2012: 234-240 - [c9]Denis Dondi, Stefano Scorcioni, Alessandro Bertacchini
An autonomous wireless sensor network device powered by a RF energy harvesting system. IECON 2012: 2557-2562 - 2011
- [c8]Marcello Ganzerli, Luca Larcher
An inductor-less 13.5-Gbps 8-mW analog equalizer for multi-channel multi-frequency operation. ISCAS 2011: 189-192 - 2010
- [j8]Luca Larcher
High-kappa related reliability issues in advanced non-volatile memories. Microelectron. Reliab. 50(9-11): 1251-1258 (2010) - [c7]Andrea Pallotta, Wissam Eyssa, Luca Larcher
Millimeter-wave 14dBm CMOS power amplifier with input-output distributed transformers. CICC 2010: 1-4 - [c6]Luca Larcher
Fundamental reliability issues of advanced charge-trapping Flash memory devices. ICECS 2010: 1009-1012
2000 – 2009
- 2009
- [j7]Davide Brunelli
Photovoltaic scavenging systems: Modeling and optimization. Microelectron. J. 40(9): 1337-1344 (2009) - [c5]Luca Larcher, Riccardo Brama, Marcello Ganzerli, Jacopo Iannacci, Marco Bedani, Antonio Gnudi:
A MEMS reconfigurable quad-band Class-E Power Amplifier for GSM standard. DATE 2009: 364-368 - [c4]Kanber Mithat Silay, Denis Dondi, Luca Larcher
Load Optimization of an Inductive Power Link for Remote Powering of Biomedical Implants. ISCAS 2009: 533-536 - 2008
- [j6]Riccardo Brama
A 30.5 dBm 48% PAE CMOS Class-E PA With Integrated Balun for RF Applications. IEEE J. Solid State Circuits 43(8): 1755-1762 (2008) - [j5]Denis Dondi, Alessandro Bertacchini
Modeling and Optimization of a Solar Energy Harvester System for Self-Powered Wireless Sensor Networks. IEEE Trans. Ind. Electron. 55(7): 2759-2766 (2008) - 2007
- [j4]Andrea Mazzanti, Luca Larcher
CMOS balanced regenerative frequency dividers for wide-band quadrature LO generation. Microelectron. J. 38(10-11): 1057-1063 (2007) - [c3]Riccardo Brama
A 1.7-GHz 31dBm differential CMOS Class-E Power Amplifier with 58% PAE. CICC 2007: 551-554 - 2006
- [j3]Andrea Mazzanti, Luca Larcher
Analysis of reliability and power efficiency in cascode class-E PAs. IEEE J. Solid State Circuits 41(5): 1222-1229 (2006) - 2005
- [c2]Andrea Mazzanti, Luca Larcher
Balanced CMOS LC-tank analog frequency dividers for quadrature LO generation. CICC 2005: 575-578 - [c1]Luca Larcher
Flash Memories for SoC: An Overview on System Constraints and Technology Issues, invited. IWSOC 2005: 73-77 - 2003
- [j2]Paolo Pavan
A complete model of E2PROM memory cells for circuit simulations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(8): 1072-1079 (2003) - 2001
- [j1]N. Galbiati, G. Ghidini, C. Cremonesi, Luca Larcher
Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. Microelectron. Reliab. 41(7): 999-1002 (2001)
Coauthor Index
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last updated on 2024-10-07 21:16 CEST by the dblp team
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