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"Functional Testbench Qualification by Mutation Analysis."

Kai Huang et al. (2015)

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DOI: 10.1155/2015/256474

access: open

type: Journal Article

metadata version: 2023-03-07

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Kai Huang, Peng Zhu, Rongjie Yan, Xiaolang Yan:
Functional Testbench Qualification by Mutation Analysis. VLSI Design 2015: 256474:1-256474:9 (2015)

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