default search action

combined dblp search
author search
venue search
publication search

ask others

"Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern ..."

Minghao Piao et al. (2024)

> Home

Details and statistics

DOI: 10.1145/3638053

access: closed

type: Journal Article

metadata version: 2024-04-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tkdd/PiaoSYJ24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tkdd/PiaoSYJ24
Minghao Piao, Yi Sheng, Jinda Yan, Cheng Hao Jin:
Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification. ACM Trans. Knowl. Discov. Data 18(4): 75:1-75:26 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.