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"BIRA With Optimal Repair Rate Using Fault-Free Memory Region for Area ..."
Chang-Hyun Oh, Sae-Eun Kim, Joon-Sung Yang (2017)
- Chang-Hyun Oh, Sae-Eun Kim, Joon-Sung Yang:
BIRA With Optimal Repair Rate Using Fault-Free Memory Region for Area Reduction. IEEE Trans. Circuits Syst. I Regul. Pap. 64-I(12): 3160-3171 (2017)
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