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"Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel ..."

Dennis D. Weller et al. (2022)

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DOI: 10.1109/TCAD.2021.3064440

access: closed

type: Journal Article

metadata version: 2022-03-15

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  - https://dblp.org/rec/journals/tcad/WellerHBT22
Dennis D. Weller, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori:
Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 695-708 (2022)

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