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"A Generic Data-Driven Nonparametric Framework for Variability Analysis of ..."

S. Mukhopadhyay (2009)

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DOI: 10.1109/TCAD.2009.2017429

access: closed

type: Journal Article

metadata version: 2020-09-24

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S. Mukhopadhyay:
A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(7): 1038-1046 (2009)

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