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"Using implications to choose tests through suspect fault identification."

Jennifer Dworak et al. (2012)

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DOI: 10.1145/2390191.2390205

access: closed

type: Journal Article

metadata version: 2020-03-27

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  - journals/todaes/DworakNASIB12
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  - https://dblp.org/rec/journals/todaes/DworakNASIB12
Jennifer Dworak, Kundan Nepal, Nuno Alves, Yiwen Shi, Nicholas Imbriglia, R. Iris Bahar:
Using implications to choose tests through suspect fault identification. ACM Trans. Design Autom. Electr. Syst. 18(1): 14:1-14:19 (2012)

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