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"A Max-Relevance-Min-Divergence criterion for data discretization with ..."
Shihe Wang et al. (2024)
- Shihe Wang, Jianfeng Ren, Ruibin Bai, Yuan Yao, Xudong Jiang:
A Max-Relevance-Min-Divergence criterion for data discretization with applications on naive Bayes. Pattern Recognit. 149: 110236 (2024)
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