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"T-Scan Electrical Impedance Imaging System for Anomaly Detection."

Habib Ammari et al. (2004)

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DOI: 10.1137/S003613990343375X

access: closed

type: Journal Article

metadata version: 2020-05-20

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  - journals/siamam/AmmariKSW04
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  - https://dblp.org/rec/journals/siamam/AmmariKSW04
Habib Ammari, Ohin Kwon, Jin Keun Seo, Eung Je Woo:
T-Scan Electrical Impedance Imaging System for Anomaly Detection. SIAM J. Appl. Math. 65(1): 252-266 (2004)

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