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"Wafer defect identification with optimal hyper-parameter tuning of support ..."

Santi Kumari Behera et al. (2024)

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DOI: 10.1007/S13198-023-02220-8

access: closed

type: Journal Article

metadata version: 2024-04-01

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  - https://dblp.org/rec/journals/saem/BeheraDAS24
Santi Kumari Behera, Shishir Prasad Dash, Rajat Amat, Prabira Kumar Sethy:
Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101. Int. J. Syst. Assur. Eng. Manag. 15(3): 1294-1304 (2024)

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