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"Experimental investigation of Zener diode reliability under pulsed ..."

Jian-Zhi Zhu et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.077

access: closed

type: Journal Article

metadata version: 2021-04-29

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Jian-Zhi Zhu, François Fouquet, Blaise Ravelo, A. Alaeddine, Moncef Kadi:
Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS). Microelectron. Reliab. 53(9-11): 1288-1292 (2013)

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