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"Study of the impact of hot carrier injection to immunity of MOSFET to ..."

Binhong Li et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.010

access: closed

type: Journal Article

metadata version: 2023-11-20

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Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García:
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectron. Reliab. 51(9-11): 1557-1560 (2011)

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