default search action

combined dblp search
author search
venue search
publication search

ask others

"The impact of BTI aging on the reliability of level shifters in nano-scale ..."

Basel Halak, Vasileios Tenentes, Daniele Rossi (2016)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.10.018

access: closed

type: Journal Article

metadata version: 2024-08-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/HalakTR16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/HalakTR16
Basel Halak, Vasileios Tenentes, Daniele Rossi:
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. Microelectron. Reliab. 67: 74-81 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.