default search action

combined dblp search
author search
venue search
publication search

ask others

"Conducted EMI evolution of power SiC MOSFET in a Buck converter after ..."

Shawki Douzi et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.06.092

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/DouziKBTS18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/DouziKBTS18
Shawki Douzi, Moncef Kadi, Habib Boulzazen, Mohamed Tlig, Jaleleddine Ben Hadj Slama:
Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests. Microelectron. Reliab. 88-90: 219-224 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.