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"Characterization, design, modeling, and model validation of silicon-wafer ..."

Francis M. Rotella et al. (2006)

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DOI: 10.1109/JSSC.2006.872736

access: closed

type: Journal Article

metadata version: 2021-10-15

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  - https://dblp.org/rec/journals/jssc/RotellaCTCZ06
Francis M. Rotella, Cristian Cismaru, Yevgeniy Gene Tkachenko, Yuhua Cheng, Peter J. Zampardi:
Characterization, design, modeling, and model validation of silicon-wafer M: N balun components under matched and unmatched conditions. IEEE J. Solid State Circuits 41(5): 1201-1209 (2006)

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