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"A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs."

Goichi Ono et al. (2014)

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DOI: 10.1587/TRANSELE.E97.C.215

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/OnoMNK14
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/OnoMNK14
Goichi Ono, Yuki Mori, Michiaki Nakayama, Yusuke Kanno:
A Method for Measuring of RTN by Boosting Word-Line Voltage in 6-Tr-SRAMs. IEICE Trans. Electron. 97-C(3): 215-221 (2014)

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