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"Probabilistic model for nanocell reliability evaluation in presence of ..."

Renu Kumawat, Vineet Sahula, Manoj Singh Gaur (2015)

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DOI: 10.1049/IET-CDT.2014.0124

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/KumawatSG15
Renu Kumawat, Vineet Sahula, Manoj Singh Gaur:
Probabilistic model for nanocell reliability evaluation in presence of transient errors. IET Comput. Digit. Tech. 9(4): 213-220 (2015)

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