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"Bayesian Analysis of the Sequential Inspection Plan via the Gibbs Sampler."

Young H. Chun (2008)

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DOI: 10.1287/OPRE.1070.0501

access: closed

type: Journal Article

metadata version: 2020-03-31

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Young H. Chun:
Bayesian Analysis of the Sequential Inspection Plan via the Gibbs Sampler. Oper. Res. 56(1): 235-246 (2008)

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