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"Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive ..."

Michihiro Shintani et al. (2016)

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DOI: 10.1007/S10836-016-5614-0

access: closed

type: Journal Article

metadata version: 2024-06-17

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Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, Takashi Sato:
Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing. J. Electron. Test. 32(5): 601-609 (2016)

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