default search action

combined dblp search
author search
venue search
publication search

ask others

"Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems ..."

Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira (1999)

> Home

Details and statistics

DOI: 10.1023/A:1008374027849

access: closed

type: Journal Article

metadata version: 2022-10-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/DiasTT99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/DiasTT99
Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira:
Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electron. Test. 14(1-2): 149-158 (1999)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.