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"Automatic target defect identification for TFT-LCD array process ..."

Yi-Hung Liu et al. (2009)

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DOI: 10.1016/J.ESWA.2007.12.015

access: closed

type: Journal Article

metadata version: 2017-05-26

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  - https://dblp.org/rec/journals/eswa/LiuLHL09
Yi-Hung Liu, Szu-Hsien Lin, Yi-Ling Hsueh, Ming-Jiu Lee:
Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble. Expert Syst. Appl. 36(2): 1978-1998 (2009)

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